MEASUREMENTS OF THE BREMSSTRAHLUNG BACKGROUND IN SOFT-X-RAY APPEARANCE-POTENTIAL SPECTROSCOPY

被引：1
|
作者：
SHINDE, PS
PADALIA, BD
机构：
[1] INDIAN INST TECHNOL,DEPT PHYS,BOMBAY 400076,INDIA
[2] INDIAN INST TECHNOL,CTR REG SOPHISTICATED INSTRUMENTAT,BOMBAY 400076,INDIA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 82卷 / 01期
关键词：
D O I：
10.1016/0168-583X(93)95103-C
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In continuation of our recent report on the design and construction of a versatile soft x-ray appearance potential spectrometer using a Cu-BeO photoelectron multiplier, the results of our measurements of the bremsstrahlung background as a function of spectrometer parameters are discussed.
引用
收藏
页码：196 / 199
页数：4
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