APPLICATION OF DYNAMIC BACKGROUND SUBTRACTION TO QUANTIFICATION OF AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES

被引：0
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作者：
GRANT, JT
HAAS, TW
HOUSTON, JE
机构：
[1] USAF,AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433
[2] SANDIA LABS,ALBUQUERQUE,NM 87115
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年
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中图分类号：
O59 [应用物理学];
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页码：811 / 814
页数：4
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