X-RAY-DIFFRACTION ON MICROCRYSTALS WITH SYNCHROTRON RADIATION

被引：3
|
作者：
RIECK, W
SCHULZ, H
SIEDEL, M
机构：
[1] Institut f:ur Kristallographie und Mineralogie, Universität München, D-8000 München 2
来源：
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 1991年 / 52卷 / 10期
关键词：
ABSORPTION; BACKGROUND; COUNTER; DATA COLLECTION; DETECTOR; DIFFRACTION; DIFFRACTOMETER; DIVERGENCE; EXTINCTION; INTENSITY; KINEMATICAL THEORY; MICROCRYSTAL; ORIENTATION (OF CRYSTALS); PREPARATION; SCATTERING POWER; SIZE (OF CRYSTALS); SYNCHROTRON RADIATION; WIGGLER;
D O I：
10.1016/0022-3697(91)90205-E
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Very small single crystals were used for X-ray diffraction experiments with synchrotron radiation. From such micro-crystals data sets are expected that are nearly free from systematic errors as e.g. extinction or absorption. A CaF2 crystal with a volume of 2.2-mu-m3 was mounted on a glass capillary. It was oriented and its reflections were measured in the 1.56 angstrom focused synchrotron radiation beam of a six-pole wiggler.
引用
收藏
页码：1289 / 1291
页数：3
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