SYNCHROTRON X-RAY-DIFFRACTION APPLIED TO THE STUDY OF PHYSISORBED MONOLAYERS

被引：2
|
作者：
NIELSEN, M [1 ]
BOHR, J [1 ]
KJAER, K [1 ]
ALSNIELSEN, J [1 ]
MCTAGUE, JP [1 ]
机构：
[1] BROOKHAVEN NATL LAB,UPTON,NY 11973
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期
关键词：
D O I：
10.1016/0167-5087(83)91180-8
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：549 / 554
页数：6
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