THIN FILM THICKNESS BY X-RAY TRANSMISSION

被引：0
|
作者：
BOSTER, TA
机构：
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1971年 / 16卷 / 08期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：836 / &
相关论文
共 50 条
  • [41] THIN FILM SURFACE STUDIES BY X-RAY REFLECTION
    CROCE, P
    DEVANT, G
    SERE, MG
    VERHAEGHE, MF
    SURFACE SCIENCE, 1970, 22 (01) : 173 - +
  • [42] In situ X-ray investigations of thin film growth
    Research Inst of Vacuum Technique, Moscow, Russia
    Thin Solid Films, 1-2 (63-67):
  • [43] ON ESTIMATION OF ALLOY FILM THICKNESS BY X-RAY FLUORESCENT SPECTROSCOPY
    HIROKAWA, K
    GOTO, H
    BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1968, 41 (03) : 747 - +
  • [44] X-RAY DETERMINATION OF FILM THICKNESS USING GLASSY HALO
    FISCHER, GR
    EVANS, DL
    AMERICAN CERAMIC SOCIETY BULLETIN, 1972, 51 (04): : 371 - &
  • [45] X-RAY DIFFRACTOMETER CONTROL OF FILM AND FOIL THICKNESS.
    Kolerov, O.K.
    Logvinov, A.N.
    Mishin, M.I.
    Skryabin, V.G.
    Yushin, V.D.
    Measurement Techniques, 1984, 27 (12) : 1082 - 1074
  • [46] FILM THICKNESS DETERMINATION FROM SUBSTRATE X-RAY REFLECTIONS
    KEATING, DT
    KAMMERER, OF
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1958, 29 (01): : 34 - 36
  • [47] Microstructure and X-ray analysis on LaCaMnO thin film
    Gross, Gudrun M.
    Praus, Rainer B.
    Leibold, Bernd
    Habermeier, Hanns-Ulrich
    Applied Surface Science, 1999, 138 (1-4): : 117 - 122
  • [48] Microstructure and X-ray analysis on LaCaMnO thin film
    Gross, GM
    Praus, RB
    Leibold, B
    Habermeier, HU
    APPLIED SURFACE SCIENCE, 1999, 138 : 117 - 122
  • [49] Metrological applications of X-ray waveguide thin film structures in X-ray reflectometry and diffraction
    Pelka, JB
    Lagomarsino, S
    ACTA PHYSICA POLONICA A, 2002, 102 (02) : 233 - 238
  • [50] X-ray and neutron reflectivity measurements for characterizing thin gold film x-ray reflectors
    Lodha, GS
    Basu, S
    Gupta, A
    Pandita, S
    Nandedkar, RV
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 163 (02): : 415 - 424
12345