X-RAY DIFFRACTOMETER CONTROL OF FILM AND FOIL THICKNESS.

Determination of the thicknesses of films, foils and coatings with general-purpose X-ray diffractometers is based on absorption by the material of the object being checked by rays diffracted by the substrate material. A method is obtained which provides continuous thickenss control with automatic rejection. The method is recommended for checking the thickness of amorphous, single-crystal, polycrystalline, and multilayer films and foils as well as for production and processing of the indicated materials.