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- [1] MEASUREMENTS OF EVAPORATED FILM THICKNESS AND CONCENTRATION BY ELECTRON PROBE X-RAY MICROANALYZERJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1963, 18 (08) : 1223 - &ICHINOKAWA, TYAMADA, Y
- [2] FILM THICKNESS BY X-RAY EMISSION SPECTROGRAPHYANALYTICAL CHEMISTRY, 1956, 28 (04) : 455 - 459LIEBHAFSKY, HAZEMANY, PD
- [3] THIN FILM THICKNESS BY X-RAY TRANSMISSIONBULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1971, 16 (08): : 836 - &BOSTER, TA
- [4] X-RAY SPECTROGRAPHIC MEASUREMENT OF WAX FILM THICKNESSSPECTROCHIMICA ACTA, 1960, 16 (10): : 1240 - 1240KAELBLE, EFMCEWAN, GJ
- [5] X-RAY DIFFRACTOMETER CONTROL OF FILM AND FOIL THICKNESSMEASUREMENT TECHNIQUES USSR, 1984, 27 (12): : 1082 - 1084KOLEROV, OKLOGVINOV, ANMISHIN, MISKRYABIN, VGYUSHIN, VD
- [6] X-RAY STUDIES RELATED TO COATING THICKNESS MEASUREMENTSJOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 33 - 36SEWELL, DAHALL, IDLOVE, GPARTRIDGE, JPSCOTT, VD
- [7] An examination of mass thickness measurements with X-ray sourcesAPPLIED RADIATION AND ISOTOPES, 2008, 66 (10) : 1387 - 1391Chen MincongLi HongmeiChen ZiyuShen Ji
- [8] OPTIMUM ABSORBER THICKNESS FOR X-RAY ABSORPTION MEASUREMENTSARKIV FOR FYSIK, 1960, 16 (06): : 514 - 515NORDFORS, B
- [9] THICKNESS MEASUREMENTS OF THIN COATINGS BY X-RAY ABSORPTIONPHYSICAL REVIEW, 1946, 69 (1-2): : 49 - 49BIRKS, LSFRIEDMAN, H
- [10] X-RAY DETERMINATION OF FILM THICKNESS USING GLASSY HALOAMERICAN CERAMIC SOCIETY BULLETIN, 1973, 52 (06): : 510 - 512EVANS, DLFISCHER, GR