Self-organization in irradiated semiconductor crystals caused by thermal annealing

被引:0
|
作者
Zavada, M. [1 ]
Konoreva, O. [1 ]
Lytovchenko, P. [1 ]
Opilat, V [2 ]
Pinkovska, M. [1 ]
Radkevych, O. [3 ]
Tartachnyk, V [1 ]
机构
[1] NAS Ukraine, Inst Nucl Res, 47 Prospect Nauky, UA-03028 Kiev, Ukraine
[2] Taras Shevchenko Natl Univ Kyiv, 64-13 Volodymyrska Str, UA-01601 Kiev, Ukraine
[3] NAS Ukraine, SE SRI Microdevices STC Inst Single Cristals, 3 Pivnichno Syretska Str, UA-04136 Kiev, Ukraine
关键词
gallium phosphate; defects; electron irradiation; self-organization; annealing;
D O I
10.15407/spqeo21.02.130
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Annealing of complex semiconductors GaP and CdP2, irradiated at room temperature by high fluences of electrons within 1...30 MeV energy interval and 80 MeV alpha-particles, was carried out, and main electrical parameters (conductivity sigma, carrier concentration n and mobility mu) as well as the positron lifetime tau were studied and analyzed. When the point defect concentration excesses some critical value, defects of new kind are formed: oscillation peaks in the isochronous annealing curve appear, and defects with a high cross-section of defect scattering and capture are created. High temperature annealing of the irradiated sample with increased vacancy concentration causes appearance of the vacancy voids with a lower electron density.
引用
收藏
页码:130 / 133
页数:4
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