A STUDY OF THE CHARGE CLUSTER CHARACTERISTICS AND SPATIAL-RESOLUTION OF A SILICON MICROSTRIP DETECTOR

被引：12
|
作者：
CHANG, YH [1 ]
CHEN, AE [1 ]
HOU, SR [1 ]
LIN, WT [1 ]
机构：
[1] NATL CENT UNIV,DEPT PHYS,CHUNGLI 32054,TAIWAN
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1995年 / 363卷 / 03期
关键词：
D O I：
10.1016/0168-9002(95)00426-2
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The analysis on test beam data of a large silicon microstrip detector is presented. The spatial resolution has been studied with full GEANT simulation to calculate the systematic uncertainty due to multiple scattering. Several cluster position-finding algorithms have been applied for inclined tracks. The cluster profile and spatial resolution have the predicted geometrical correlation to the track angle.
引用
收藏
页码：538 / 544
页数：7
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