INFLUENCE OF AU OVERLAYERS ON VALENCE-BAND OFFSETS FOR BURIED CAF2/SI(111) INTERFACES

被引：12
|
作者：
XU, F
VOS, M
WEAVER, JH
机构：
来源：
PHYSICAL REVIEW B | 1989年 / 39卷 / 11期
关键词：
D O I：
10.1103/PhysRevB.39.8008
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：8008 / 8011
页数：4
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