AN IN-SITU SENSOR FOR MONITORING MOLECULAR AND PHYSICAL PROPERTY CHANGES DURING FILM FORMATION

被引：0
|
作者：
KRANBUEHL, DE [1 ]
HOOD, D [1 ]
BARKSDALE, R [1 ]
机构：
[1] COLL WILLIAM & MARY,WILLIAMSBURG,VA 23187
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1995年 / 210卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：98 / PMSE
相关论文
共 50 条
  • [11] Development of an electrochemical sensor for in-situ monitoring of reactive species produced by cold physical plasma
    Nasri, Zahra
    Bruno, Giuliana
    Bekeschus, Sander
    Weltmann, Klaus-Dieter
    von Woedtke, Thomas
    Wende, Kristian
    SENSORS AND ACTUATORS B-CHEMICAL, 2021, 326
  • [12] A micromachined sensor for in-situ monitoring of plasma etching
    Baker, MD
    Brand, O
    Allen, MG
    May, GS
    1996 54TH ANNUAL DEVICE RESEARCH CONFERENCE DIGEST, 1996, : 120 - 121
  • [13] Oceanographic Sensor for in-situ temperature and conductivity monitoring
    Gong, Weidong
    Mowlem, Matt
    Kraft, Michael
    Morgan, Hywel
    OCEANS 2008 - MTS/IEEE KOBE TECHNO-OCEAN, VOLS 1-3, 2008, : 42 - +
  • [14] A PIEZOELECTRIC SENSOR FOR IN-SITU MONITORING OF XEROGRAPHIC DEVELOPERS
    RIMAI, DS
    ZARETSKY, MC
    PRIMERANO, B
    LAUKALTIS, JF
    JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY, 1995, 39 (02): : 136 - 141
  • [15] Wireless crackwire sensor for in-situ engine monitoring
    Gerardi, JJ
    Archambault, J
    Brooks, WG
    2003 IEEE AEROSPACE CONFERENCE PROCEEDINGS, VOLS 1-8, 2003, : 3045 - 3052
  • [16] In-situ monitoring of product shrinkage during injection molding using an optical sensor
    Thomas, CL
    Bur, AJ
    POLYMER ENGINEERING AND SCIENCE, 1999, 39 (09): : 1619 - 1627
  • [17] In-situ monitoring of product shrinkage during injection molding using an optical sensor
    Bur, AJ
    Thomas, CL
    ANTEC '99: PLASTICS BRIDGING THE MILLENNIA, CONFERENCE PROCEEDINGS, VOLS I-III: VOL I: PROCESSING; VOL II: MATERIALS; VOL III: SPECIAL AREAS;, 1999, : 710 - 714
  • [18] CHANGES IN ELECTRICAL DEVICE CHARACTERISTICS DURING THE FORMATION OF DISLOCATIONS IN-SITU IN THE TEM
    ROSS, FM
    HULL, R
    BAHNCK, D
    BEAN, JC
    PETICOLAS, LJ
    KING, CA
    KOLA, RR
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 245 - 248
  • [19] Real time, in-situ, monitoring of apoferritin crystallization and defect formation with molecular resolution
    Yau, ST
    Thomas, BR
    Vekilov, PG
    JOURNAL OF CRYSTAL GROWTH, 2001, 232 (1-4) : 188 - 194
  • [20] In-situ monitoring of the growth of nanostructured aluminum thin film
    Novotny, Michal
    Bulir, Jiri
    Lancok, Jan
    Pokorny, Petr
    Bodnar, Michal
    JOURNAL OF NANOPHOTONICS, 2011, 5
12345