共 50 条
- [31] APPLICATIONS OF A SEMICONDUCTOR BACKSCATTERED ELECTRON DETECTOR IN A SCANNING ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (07): : 607 - 610
- [32] SECONDARY-ELECTRON DETECTOR FOR SHIELDED SCANNING ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (03): : 286 - 286
- [33] CONTRAST OF SECONDARY-ELECTRON IMAGE OF SCANNING ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (01): : 95 - &
- [35] DIRECT OBSERVATION OF DEFECT CONTRAST IN HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S200 - S200
- [36] FORMATION OF RELIEF CONTRAST OF EXTENDED SURFACES IN ELECTRON EMISSION MICROSCOPE AND SCANNING MICROSCOPE OPTIK, 1968, 27 (07): : 438 - &