CONTRAST OF SECONDARY-ELECTRON IMAGE OF SCANNING ELECTRON-MICROSCOPE

被引：0

|

作者：

SAKATA, S

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1972年 / 21卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：95 / &

相关论文

共 50 条

[1] IMAGE SIMULATION FOR SECONDARY-ELECTRON MICROGRAPHS IN THE SCANNING ELECTRON-MICROSCOPE
JOY, DC
SCANNING MICROSCOPY, 1988, 2 (01) : 57 - 64
[2] SECONDARY-ELECTRON DETECTION IN THE SCANNING ELECTRON-MICROSCOPE
BALASUBRAMANYAM, M
MUNRO, E
TAYLOR, J
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 363 (1-2): : 270 - 275
[3] SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE
SEILER, H
JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) : R1 - R18
[4] EFFECTS OF SECONDARY-ELECTRON DETECTOR POSITION ON SCANNING ELECTRON-MICROSCOPE IMAGE
KAWAMOTO, H
YAMAZAKI, S
ISHIKAWA, A
BUCHANAN, R
SCANNING ELECTRON MICROSCOPY, 1984, : 15 - 22
[5] THE EFFECT OF ELECTRON BACKSCATTERING ON CONTRAST FORMATION IN THE SECONDARY-ELECTRON PRODUCED IN THE SCANNING ELECTRON-MICROSCOPE
ROBINSON, VNE
JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (04): : 276 - 276
[6] CONTRAST AND RESOLUTION OF SECONDARY-ELECTRON IMAGES IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
LIU, J
COWLEY, JM
SCANNING MICROSCOPY, 1988, 2 (04) : 1957 - 1970
[7] AN IMAGING SECONDARY-ELECTRON DETECTOR FOR THE SCANNING ELECTRON-MICROSCOPE
HASSELBACH, F
RIEKE, U
STRAUB, M
SCANNING ELECTRON MICROSCOPY, 1983, : 467 - 478
[8] SECONDARY-ELECTRON DETECTOR FOR SHIELDED SCANNING ELECTRON-MICROSCOPE
EGUCHI, H
TAGATA, S
YAMANOUC.S
KURODA, H
JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (03): : 286 - 286
[9] SECONDARY-ELECTRON IMAGING IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
ALLEN, RM
SCANNING ELECTRON MICROSCOPY, 1985, : 905 - 918
[10] SECONDARY-ELECTRON DETECTION IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
IMESON, D
MILNE, RH
BERGER, SD
MCMULLAN, D
ULTRAMICROSCOPY, 1985, 17 (03) : 243 - 249

← 1 2 3 4 5 →