CONTRAST OF SECONDARY-ELECTRON IMAGE OF SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

SAKATA, S

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1972年 / 21卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：95 / &

共 50 条

[21] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE
WATANABE, T
DENKI KAGAKU, 1986, 54 (08): : 667 - 670
[22] OBSERVATION OF BIOLOGICAL SPECIMENS USING THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE EQUIPPED WITH SECONDARY-ELECTRON DETECTOR
TAMURA, E
KATOH, M
YAMAMOTO, I
JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (03): : 333 - 333
[23] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE
MIYAUCHI, K
WATANABE, T
KUBOZOE, M
JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256
[24] MEASUREMENT OF SURFACE VACUUM POTENTIAL FROM THE ENERGY-SPECTRUM OF THE SECONDARY-ELECTRON IN THE SCANNING ELECTRON-MICROSCOPE
NAKAMAE, K
FUJIOKA, H
URA, K
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1991, 30 (04): : 875 - 881
[25] CALCULATION OF A TOPOGRAPHIC CONTRAST IN THE SCANNING ELECTRON-MICROSCOPE
KOTERA, M
FUJIWARA, T
YAMAGUCHI, S
SUGA, H
SCANNING MICROSCOPY, 1993, 7 (02) : 547 - 554
[26] SECONDARY-ELECTRON IMAGES BY SCANNING ION-MICROSCOPE
ANAZAWA, N
AIHARA, R
OKUNUKI, M
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (03) : C110 - C110
[27] ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS
COWLEY, JM
IIJMA, S
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03): : 445 - +
[28] FOCUSED IMAGE CONTRAST IN A MIRROR ELECTRON-MICROSCOPE
SEDOV, NN
RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR, 1971, 16 (04): : 717 - &
[29] SCANNING ELECTRON-MICROSCOPE
EVERHART, TE
HAYES, TL
SCIENTIFIC AMERICAN, 1972, 226 (01) : 54 - &
[30] SCANNING ELECTRON-MICROSCOPE
NEELAKANTAN, P
COLOURAGE, 1980, 27 (07): : 5 - &

← 1 2 3 4 5 →