IMPROVED SECONDARY ION MASS-SPECTROMETER FOR MICROANALYSIS

被引:0
|
作者
STEIN, JD [1 ]
STORMS, HA [1 ]
机构
[1] GE,VALLECITOS NUCL CTR,PLEASANTON,CA 94566
来源
JOURNAL OF ELECTRON MICROSCOPY | 1977年 / 26卷 / 02期
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中图分类号
TH742 [显微镜];
学科分类号
摘要
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页码:178 / 178
页数:1
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