IMPROVED SECONDARY ION MASS-SPECTROMETER FOR MICROANALYSIS

被引：0
|
作者：
STEIN, JD [1 ]
STORMS, HA [1 ]
机构：
[1] GE,VALLECITOS NUCL CTR,PLEASANTON,CA 94566
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1977年 / 26卷 / 02期
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：178 / 178
页数：1
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