ELECTRON-CYCLOTRON RESONANCE PLASMA-ETCHING USING DOWNSTREAM MAGNETIC CONFINEMENT

We demonstrate that electron cyclotron resonance plasma etching with a magnetically confined plasma in the region of the sample produces an enhanced etch rate, an anisotropic etch profile, and low self-bias voltage. Results are presented for GaAs etch rates, etch profiles, and macroscopic etch uniformity using a SiCl4 plasma, comparing the effects of a confining magnetic field and a diverging magnetic field in the reactor. The etch rates and saturated ion current density to the sample are found to be correlated. An anisotropic near vertical etch profile with smooth-etched surfaces is obtained with a negative self-bias voltage of typically 5-25 V for electrically floating samples in a magnetically confined plasma. When the magnetic field lines are perpendicular to the sample surface, the measured macroscopic etch uniformity is +/-6% ac ross a 5 cm diam wafer.