USE OF MOIRE PATTERNS IN HOLOGRAPHIC INTERFEROMETRY OF HIGH SENSITIVITY

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作者：

MUSTAFIN, KS

SELEZNEV, VA

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OPTIKA I SPEKTROSKOPIYA | 1972年 / 32卷 / 03期

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O43 [光学];

学科分类号：

070207 ; 0803 ;

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页码：400 / &

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