SIMULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF A WEDGE-SHAPED CRYSTAL, MGO

被引:0
|
作者
TANJI, T
MASAOKA, H
ITO, J
机构
来源
JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 06期
关键词
D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:409 / 414
页数:6
相关论文
共 50 条
  • [31] APPROXIMATIONS FOR CALCULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF THIN-FILMS
    FEJES, PL
    ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1): : 109 - &
  • [32] HIGH-RESOLUTION ELECTRON-MICROSCOPE AND COMPUTED IMAGES OF HUMAN TOOTH ENAMEL CRYSTALS
    BRES, EF
    BARRY, JC
    HUTCHISON, JL
    JOURNAL OF ULTRASTRUCTURE RESEARCH, 1985, 90 (03): : 261 - 274
  • [33] 1-MV HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES AND CHROMATIC ABERRATION
    HORIUCHI, S
    MATSUI, Y
    BANDO, Y
    SEKIKAWA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1978, 27 (04): : 356 - 356
  • [34] CALCULATION AND INTERPRETATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF LATTICE-DEFECTS
    ANSTIS, GR
    COCKAYNE, DJH
    ACTA CRYSTALLOGRAPHICA SECTION A, 1979, 35 (JUL): : 511 - 524
  • [35] SIMULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES AND 2-DIMENSIONAL CONVERGENT BEAM ELECTRON-DIFFRACTION PATTERNS
    STADELMANN, PA
    BUFFAT, PA
    COMPUTER SIMULATION OF ELECTRON MICROSCOPE DIFFRACTION AND IMAGES, 1989, : 159 - 169
  • [36] ON DIRECT OBSERVATION OF THE ATOMIC-STRUCTURE OF A CRYSTAL WITH A HIGH-RESOLUTION ELECTRON-MICROSCOPE
    INDENBOM, VL
    TOCHILIN, SB
    ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1990, 98 (04): : 1402 - 1411
  • [37] ULTRA HIGH-RESOLUTION IMAGING WITH A TRANSMISSION ELECTRON-MICROSCOPE
    ISAKOZAWA, S
    TSURUTA, T
    SHINOHARA, M
    SATO, Y
    NOMURA, S
    KUBOZOE, M
    JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 249 - 250
  • [38] HIGH-RESOLUTION 400-KV ELECTRON-MICROSCOPE
    HONDA, T
    IBE, K
    SUZUKI, S
    ISHIDA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1985, 34 (03): : 215 - 215
  • [39] 200-KV HIGH-RESOLUTION ELECTRON-MICROSCOPE
    NARUSE, M
    YONEZAWA, A
    WATANABE, E
    HARADA, Y
    SAKURAI, S
    JOURNAL OF ELECTRON MICROSCOPY, 1979, 28 (03): : 225 - 225
  • [40] IMPROVING A CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPE FOR HIGH-RESOLUTION
    OIKAWA, T
    KIMURA, C
    HOJOU, K
    BABA, N
    KANAYA, K
    ULTRAMICROSCOPY, 1979, 4 (04) : 473 - 477