RING TESTING - CIRCUITS AND RELIABILITY

被引:0
|
作者
STOLOV, EL
机构
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:119 / 124
页数:6
相关论文
共 50 条
  • [1] RELIABILITY TESTING OF BAC HYBRID CIRCUITS
    TAYLOUR, CH
    [J]. MICROELECTRONICS AND RELIABILITY, 1977, 16 (04): : 295 - 302
  • [2] RING TESTING OF COMBINATIONAL-CIRCUITS
    LITIKOV, IP
    [J]. AUTOMATION AND REMOTE CONTROL, 1983, 44 (07) : 949 - 955
  • [3] RELIABILITY OF RINGWISE TESTING OF LINEAR SEQUENTIAL-CIRCUITS
    LATYPOV, RK
    [J]. AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1984, (04): : 89 - 91
  • [4] Novel technique for reliability testing of silicon integrated circuits
    LeMinh, P
    Wallinga, H
    Woerlee, PH
    van den Berg, A
    Holleman, J
    [J]. IN-LINE CHARACTERIZATION, YIELD, RELIABILITY, AND FAILURE ANALYSIS IN MICROELECTRONIC MANUFACTURING II, 2001, 4406 : 185 - 190
  • [5] QUALITY ASSURANCE SYSTEM AND RELIABILITY TESTING OF LSI CIRCUITS
    WURNIK, FM
    [J]. MICROELECTRONICS AND RELIABILITY, 1983, 23 (04): : 709 - 715
  • [6] Reliability Characterization of Ring Oscillator Circuits for Advanced CMOS Technologies
    Kerber, Andreas
    Nigam, Tanya
    Paliwoda, Peter
    Guarin, Fernando
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2020, 20 (02) : 230 - 241
  • [7] TESTING AND RELIABILITY OF THROUGHPLATINGS IN THIN-FILM HYBRID-CIRCUITS
    KADEREIT, HG
    KOCH, D
    SCHLEMM, A
    [J]. F&M-FEINWERKTECHNIK & MESSTECHNIK, 1981, 89 (05): : 209 - 213
  • [8] RUGGEDNESS TESTING BOLSTERS POWER MOSFET RELIABILITY IN HIGH-STRESS CIRCUITS
    CARLSON, PJ
    [J]. ELECTRONIC DESIGN, 1986, 34 (06) : 147 - &
  • [9] Assessing device reliability margin in scaled CMOS technologies using ring oscillator circuits
    Kerber, A.
    Cimino, S.
    Guarin, F.
    Nigam, T.
    [J]. 2017 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM), 2017, : 28 - 30
  • [10] RELIABILITY OF SWITCHING CIRCUITS
    MALYUGIN, VD
    [J]. AUTOMATION AND REMOTE CONTROL, 1965, 25 (09) : 1235 - &