HIGH-RESOLUTION TRANSMISSION INFRARED-LASER SCANNING MICROSCOPY OF SEMIINSULATING, LEC GAAS

被引:0
|
作者
KIDD, P
STIRLAND, DJ
BOOKER, GR
机构
[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD OX1 3PH,ENGLAND
[2] PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCHESTER NN12 8EQ,NORTHANTS,ENGLAND
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:C577 / C578
页数:2
相关论文
共 50 条
  • [21] Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy
    Hovden, Robert
    Xin, Huolin L.
    Muller, David A.
    MICROSCOPY AND MICROANALYSIS, 2011, 17 (01) : 75 - 80
  • [22] Advanced techniques in automated high-resolution scanning transmission electron microscopy
    Pattison, Alexander J.
    Pedroso, Cassio C. S.
    Cohen, Bruce E.
    Ondry, Justin C.
    Alivisatos, A. Paul
    Theis, Wolfgang
    Ercius, Peter
    NANOTECHNOLOGY, 2024, 35 (01)
  • [23] High-resolution low-dose scanning transmission electron microscopy
    Buban, James P.
    Ramasse, Quentin
    Gipson, Bryant
    Browning, Nigel D.
    Stahlberg, Henning
    JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 (02): : 103 - 112
  • [24] HIGH-RESOLUTION SCANNING ION MICROSCOPY
    SCHWARZSCHILD, BM
    PHYSICS TODAY, 1982, 35 (07) : 20 - 22
  • [25] HIGH-RESOLUTION INFRARED-LASER INDUCED FLUORESCENCE STUDY OF STATE MIXING IN METHYL FORMATE
    MINTON, TK
    KIM, HL
    REID, SA
    MCDONALD, JD
    JOURNAL OF CHEMICAL PHYSICS, 1988, 89 (10): : 6550 - 6552
  • [26] RESOLUTION AND CONTRAST OF CRYSTALLINE OBJECTS IN HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPY.
    Fertig, J.
    Rose, H.
    Optik (Jena), 1981, 59 (05): : 407 - 429
  • [27] High-Resolution Scanning Transmission Electron Microscopy (HRSTEM) Techniques: High-Resolution Imaging and Spectroscopy Side by Side
    Stroppa, Daniel G.
    Zagonel, Luiz F.
    Montoro, Luciano A.
    Leite, Edson R.
    Ramirez, Antonio J.
    CHEMPHYSCHEM, 2012, 13 (02) : 437 - 443
  • [28] High-resolution transmission electron microscopy of AlAs-GaAs semiconductor superlattices
    Ikarashi, N
    Ishida, K
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1996, 7 (04) : 285 - 295
  • [29] High-resolution transmission electron microscopy of AlAs/GaAs/AlGaAs multilayer heterostructure
    Nishio, K.
    Katcki, J.
    Shiojiri, M.
    Electron Technology (Warsaw), 1999, 32 (04): : 348 - 353
  • [30] RECENT ADVANCES IN HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
    BOVEY, PE
    DESPORTES, AD
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1985, 10 (05): : 377 - 379