RECENT ADVANCES IN HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY

被引：0

作者：

BOVEY, PE ^{[1
]}

DESPORTES, AD ^{[1
]}

机构：

[1] VG INSTRUMENTS SA,F-78150 LE CHESNAY,FRANCE

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1985年 / 10卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：377 / 379

页数：3

共 50 条

[1] RECENT ADVANCES IN HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
BOVEY, P
DESPORTES, A
[J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1985, 10 (02): : A53 - A53
[2] SCANNING-TRANSMISSION ELECTRON-MICROSCOPY AT HIGH-RESOLUTION
WALL, J
LANGMORE, J
ISAACSON, M
CREWE, AV
[J]. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1974, 71 (01) : 1 - 5
[3] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
CREWE, AV
[J]. SCIENCE, 1983, 221 (4608) : 325 - 330
[4] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
LIU, J
COWLEY, JM
[J]. ULTRAMICROSCOPY, 1993, 52 (3-4) : 335 - 346
[5] RESOLUTION AND CONTRAST OF CRYSTALLINE OBJECTS IN HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
FERTIG, J
ROSE, H
[J]. OPTIK, 1981, 59 (05): : 407 - 429
[6] PREPARATION OF CYTOSKELETONS OF CELLS IN CULTURE FOR HIGH-RESOLUTION SCANNING AND SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
BELL, PB
LINDROTH, M
FREDRIKSSON, BA
[J]. SCANNING MICROSCOPY, 1988, 2 (03) : 1647 - 1661
[7] HIGH-RESOLUTION SECONDARY-ELECTRON IMAGING IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPY INSTRUMENT
LIU, J
COWLEY, JM
[J]. SCANNING MICROSCOPY, 1988, 2 (01) : 65 - 81
[8] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY - ASPECTS AND TRENDS OF A NEW METHOD
WILLASCH, D
[J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 505 - 506
[9] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF POLYMER SINGLE-CRYSTALS
KRAUSE, SJ
ALLARD, LF
BIGELOW, WC
[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 370 - 370
[10] SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
BROWN, LM
[J]. JOURNAL DE PHYSIQUE IV, 1993, 3 (C7): : 2073 - 2080

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