NEUTRON MEASUREMENTS ON AN EPITAXIAL THIN-FILM OF YBACUO

被引：0

作者：

CROW, ML ^{[1
]}

PICKART, SJ ^{[1
]}

NUNES, AC ^{[1
]}

MCGUIRE, TR ^{[1
]}

GUPTA, A ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF APPLIED PHYSICS | 1991年 / 70卷 / 10期

关键词：

D O I：

10.1063/1.350146

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report evidence for an ordered flux line lattice in a 2-mu-m epitaxial film of YBaCuO from both neutron depolarization and diffraction measurements. Depolarization occurred when field cooling was done normal to the film plane but not within it; this is consistent with frozen-in vortices. Evidence for ordering of the flux lines comes from intensity maxima observed in difference patterns between field cooled and zero field cooled conditions.

引用

页码：5742 / 5744

页数：3

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