BREAKDOWN IN SULPHUR HEXAFLUORIDE AND NITROGEN UNDER DIRECT AND IMPULSE VOLTAGES - REPLY

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作者：
BINNS, DF
HOOD, RJ
机构：
来源：
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1970年 / 117卷 / 05期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：1056 / &
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