ANALYZING MULTICHIP-MODULE TESTING STRATEGIES

被引：10
|
作者：
ABADIR, MS [1 ]
PARIKH, AR [1 ]
SANDBORN, PA [1 ]
DRAKE, K [1 ]
BAL, L [1 ]
机构：
[1] EASTMAN KODAK CO,ROCHESTER,MN
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1994年 / 11卷 / 01期
关键词：
D O I：
10.1109/54.262321
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：40 / 52
页数：13
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