THE CHARACTERIZATION OF CADMIUM-SULFIDE AND CADMIUM SELENIDE EPITAXIAL LAYERS GROWN BY MOCVD ON GALLIUM-ARSENIDE

被引：0
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作者：
CULLIS, AG
WILLIAMS, GM
COCKAYNE, B
WRIGHT, PJ
SMITH, PW
PARBROOK, PJ
HALSALL, MP
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来源：
MICROSCOPY OF SEMICONDUCTING MATERIALS 1989 | 1989年 / 100卷
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T [工业技术];
学科分类号：
08 ;
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页码：217 / 222
页数：6
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