EFFECT OF COULOMB SCATTERING ON SILICON SURFACE MOBILITY

被引:52
|
作者
CHENG, YC [1 ]
SULLIVAN, EA [1 ]
机构
[1] BELL NO RES,OTTAWA,ONTARIO,CANADA
关键词
D O I
10.1063/1.1662957
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:187 / 192
页数:6
相关论文
共 50 条
  • [1] The effect of surface roughness scattering on hole mobility in double gate silicon-on-insulator devices
    Donetti, Luca
    Gamiz, Francisco
    Rodriguez, Noel
    Godoy, Andres
    Sampedro, Carlos
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (02)
  • [2] EFFECT OF CHARGE INHOMOGENEITIES ON SILICON SURFACE MOBILITY
    CHENG, YC
    JOURNAL OF APPLIED PHYSICS, 1973, 44 (05) : 2425 - 2427
  • [3] Multiple Coulomb scattering in thin silicon
    Berger, N.
    Buniatyan, A.
    Eckert, P.
    Foerster, F.
    Gredig, R.
    Kovalenko, O.
    Kiehn, M.
    Philipp, R.
    Schoening, A.
    Wiedner, D.
    JOURNAL OF INSTRUMENTATION, 2014, 9
  • [4] Effect of multiple coulomb scattering on the beam tests of silicon pixel detectors
    Lan-Kun Li
    Ming-Yi Dong
    Ze Gao
    Liang-Cheng-Long Jin
    Shu-Jun Zhao
    Nuclear Science and Techniques, 2024, 35 (04) : 202 - 209
  • [5] Effect of multiple coulomb scattering on the beam tests of silicon pixel detectors
    Li, Lan-Kun
    Dong, Ming-Yi
    Gao, Ze
    Jin, Liang-Cheng-Long
    Zhao, Shu-Jun
    NUCLEAR SCIENCE AND TECHNIQUES, 2024, 35 (04)
  • [6] Simulation Study of Coulomb Mobility in Strained Silicon
    Driussi, Francesco
    Esseni, David
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2009, 56 (09) : 2052 - 2059
  • [7] Effect of Coulomb scattering from trapped charges on the mobility in an organic field-effect transistor
    Sharma, A.
    Janssen, N. M. A.
    Mathijssen, S. G. J.
    de Leeuw, D. M.
    Kemerink, M.
    Bobbert, P. A.
    PHYSICAL REVIEW B, 2011, 83 (12)
  • [8] EFFECT OF COULOMB SCATTERING IN N-TYPE SILICON INVERSION-LAYERS
    MANZINI, S
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (02) : 411 - 414
  • [9] EFFECT OF SURFACE SCATTERING ON ELECTRON MOBILITY IN INVERSION LAYER ON P-TYPE SILICON ( TRANSVERSE ELECTRIC FIELD EFFECT ON CARRIER MOBILITY E/T )
    FANG, F
    TRIEBWASSER, S
    APPLIED PHYSICS LETTERS, 1964, 4 (08) : 145 - &
  • [10] Comprehensive understanding of surface roughness and Coulomb scattering mobility in biaxially-strained Si MOSFETs
    Zhao, Yi
    Takenaka, Mitsuru
    Takagi, Shinichi
    IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2008, TECHNICAL DIGEST, 2008, : 577 - 580