AN AUTOMATED-SYSTEM FOR MEASUREMENT OF RANDOM TELEGRAPH NOISE IN METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS

被引：18

作者：

HUNG, KK ^{[1
]}

KO, PK ^{[1
]}

HU, C ^{[1
]}

CHENG, YC ^{[1
]}

机构：

[1] UNIV HONG KONG,DEPT ELECT & ELECTR ENGN,HONG KONG,HONG KONG

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1989年 / 36卷 / 06期

关键词：

D O I：

10.1109/16.24373

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1217 / 1219

页数：3

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