INSITU HVEM INVESTIGATIONS UNDER THE INFLUENCE OF ION-BEAMS

被引：0
|
作者：
JESSER, WA [1 ]
机构：
[1] UNIV VIRGINIA,DEPT MAT SCI,CHARLOTTESVILLE,VA 22903
来源：
ULTRAMICROSCOPY | 1979年 / 4卷 / 02期
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中图分类号：
TH742 [显微镜];
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页码：270 / 270
页数：1
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