SILICON JUNCTION FIELD-EFFECT TRANSISTORS AT 4.2K

被引:6
|
作者
NAWROCKI, W
机构
[1] Technical Univ of Poznan, Poland
关键词
Cryogenics - Superconducting Devices;
D O I
10.1016/0011-2275(88)90038-0
中图分类号
O414.1 [热力学];
学科分类号
摘要
The results of investigations of Polish silicon junction field effect transistors (JFETs) of the BF 245 type at liquid helium temperature are reported. The BF 245B and the BF 245C worked satisfactorily at 4.2 K but the BF 245A transistors were weakly or not controllable in liquid helium. The following changes were observed for BF 245B and 245C transistors: the transconductance is about twice as large at 4.2 K as at 300 K, the absolute value of the pinch-off voltage is about twice as small at 4.2 K and the noise voltage is ten times smaller in liquid helium.
引用
收藏
页码:394 / 397
页数:4
相关论文
共 50 条
  • [1] JUNCTION FIELD EFFECT TRANSISTORS AT 4.2K
    WAGNER, RR
    ANDERSON, PT
    BERTMAN, B
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (07): : 917 - &
  • [3] SILICON FIELD-EFFECT TRANSISTORS
    CULLIS, R
    [J]. ELECTRONIC ENGINEERING, 1965, 37 (451): : 606 - &
  • [4] BURNOUT OF JUNCTION FIELD-EFFECT TRANSISTORS
    LONG, DM
    SWANT, DH
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) : 149 - 157
  • [5] FIELD EFFECT TRANSISTORS AT 4.2 DEGREES K
    KINGSTON, FE
    LEE, K
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04): : 599 - &
  • [6] Modelling of Dynamic Properties of Silicon Carbide Junction Field-Effect Transistors (JFETs)
    Bargiel, Kamil
    Bisewski, Damian
    Zarebski, Janusz
    [J]. ENERGIES, 2020, 13 (01)
  • [8] Junctionless nanowire transistors operation at temperatures down to 4.2K
    Trevisoli, Renan
    de Souza, Michelly
    Doria, Rodrigo Trevisoli
    Kilchtyska, Valeriya
    Flandre, Denis
    Pavanello, Marcelo Antonio
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2016, 31 (11)
  • [9] NOISE MEASUREMENTS ON JUNCTION FIELD-EFFECT TRANSISTORS
    PALLOTTINO, GV
    ZIRIZZOTTI, AE
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (01): : 212 - 220
  • [10] An improved junction capacitance model for junction field-effect transistors
    Ding, Hao
    Liou, Juin J.
    Cirba, Claude R.
    Green, Keith
    [J]. SOLID-STATE ELECTRONICS, 2006, 50 (7-8) : 1395 - 1399