Optimal Phi-Divergence Tests

被引：0
|
作者：
Panayiotou, Panayiotis [1 ]
Karagrigoriou, Alex [1 ]
机构：
[1] Univ Cyprus, Dept Math & Stat, POB 20537, CY-1678 Nicosia, Cyprus
来源：
INTERNATIONAL JOURNAL OF APPLIED MATHEMATICS & STATISTICS | 2011年 / 24卷 / 11A期
关键词：
Divergence measures; goodness of fit tests; optimal tests;
D O I：
暂无
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
The aim of this work is the investigation of goodness of fit tests using measures of divergence. More specifically, we introduce a new family of divergence measures which is indexed by a positive parameter "a" and identify optimum values of "a" in order to improve the accuracy of the associated goodness of fit tests.
引用
收藏
页码：20 / 29
页数：10
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