GENERAL, LAYER-BY-LAYER, AND LOCAL ANALYSIS OF COMPACT DIELECTRICS ON A SPARK ION-SOURCE MASS-SPECTROMETER

被引：0

作者：

RAMENDIK, GI

DERZHIEV, VI

VASYUTA, YV

机构：

来源：

JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR | 1979年 / 34卷 / 07期

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D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1016 / 1020

页数：5

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