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- [1] STUDIES OF CDTE SURFACES WITH SECONDARY ION MASS-SPECTROMETRY, RUTHERFORD BACKSCATTERING AND ELLIPSOMETRY APPLIED PHYSICS, 1979, 19 (01): : 25 - 33
- [3] ION CHANNELING RUTHERFORD BACKSCATTERING SPECTROMETRY STRUCTURAL CHARACTERIZATION OF CDS CDTE HETEROSTRUCTURES MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1993, 16 (1-3): : 160 - 164
- [4] Ion channelling Rutherford backscattering spectrometry structural characterization of CdS/CdTe heterostructures Materials science & engineering. B, Solid-state materials for advanced technology, 1993, B16 (1-3): : 160 - 164
- [5] PVD processes: Rutherford backscattering spectrometry PLATING AND SURFACE FINISHING, 1996, 83 (05): : 134 - &
- [7] A new spectrometer for Rutherford backscattering spectrometry NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 229 (3-4): : 527 - 532
- [9] Development from Rutherford backscattering to high energy backscattering spectrometry APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY - PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL CONFERENCE, PTS 1 AND 2, 1997, (392): : 639 - 642