STUDIES OF CDTE SURFACES WITH SECONDARY ION MASS-SPECTROMETRY, RUTHERFORD BACKSCATTERING AND ELLIPSOMETRY

被引：63

|

作者：

HAGEALI, M

STUCK, R

SAXENA, AN

SIFFERT, P

机构：

来源：

APPLIED PHYSICS | 1979年 / 19卷 / 01期

关键词：

D O I：

10.1007/BF00900533

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：25 / 33

页数：9

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