RUTHERFORD BACKSCATTERING SPECTROMETRY OF REAL CDTE SURFACES

被引：3
|
作者：
PERILLO, E
SPADACCINI, G
VIGILANTE, M
SAVASTANO, M
MANCINI, AM
QUIRINI, A
VASANELLI, L
GIORGI, R
机构：
[1] IST NAZL FIS NUCL,NAPOLI,ITALY
[2] UNIV BARI,DEPARTIMENTO FIS,I-70124 BARI,ITALY
[3] IST NAZL FIS NUCL,BARI,ITALY
[4] UNIV LECCE,DEPARTIMENTO FIS,I-73100 LECCE,ITALY
[5] ENERGIA NUCL & ENERGIA ALTERNAT,CTR RIC CASACCIA,DIPARTIMENTO TIB,ROMA,ITALY
来源：
VACUUM | 1989年 / 39卷 / 2-4期
关键词：
D O I：
10.1016/0042-207X(89)90177-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：125 / 127
页数：3
相关论文
共 50 条
  • [31] The characterization of asymmetric alumina membranes by Rutherford backscattering spectrometry
    Pesiri, DR
    Snow, RC
    Elliott, N
    Maggiore, C
    Dye, RC
    JOURNAL OF MEMBRANE SCIENCE, 2000, 176 (02) : 209 - 221
  • [32] Diffusion of Sr in fluorphlogopite determined by Rutherford backscattering spectrometry
    Hammouda, T
    Cherniak, DJ
    EARTH AND PLANETARY SCIENCE LETTERS, 2000, 178 (3-4) : 339 - 349
  • [33] Photoluminescence mapping and Rutherford Backscattering Spectrometry of InGaN epilayers
    O'Donnell, KP
    White, ME
    Pereira, S
    Wu, MF
    Vantomme, A
    Van der Stricht, W
    Jacobs, K
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1999, 216 (01): : 171 - 174
  • [34] NiTi thin film characterization by Rutherford backscattering spectrometry
    Goldberg, F
    Knystautas, EJ
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 40 (2-3): : 185 - 189
  • [35] Thin-film morphology and Rutherford backscattering spectrometry
    Hahn, T
    Metzner, H
    Gossla, M
    Conrad, J
    MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES, 1997, 248-2 : 409 - 412
  • [36] RUTHERFORD BACKSCATTERING INVESTIGATIONS OF MELTING AND PREMELTING PHENOMENA AT SURFACES
    PLUIS, B
    FRENKEN, JWM
    VANDERVEEN, JF
    PHYSICA SCRIPTA, 1987, T19B : 382 - 386
  • [37] Interpretation of electron Rutherford backscattering spectrometry for hydrogen quantification
    Alvarez, Rafael
    Yubero, Francisco
    SURFACE AND INTERFACE ANALYSIS, 2014, 46 (10-11) : 812 - 816
  • [38] Oxidation of SiC investigated by ellipsometry and Rutherford backscattering spectrometry
    Szilagyi, E.
    Petrik, P.
    Lohner, T.
    Koos, A. A.
    Fried, M.
    Battistig, G.
    JOURNAL OF APPLIED PHYSICS, 2008, 104 (01)
  • [39] ANALYSIS OF METALLIC LAYER SYSTEMS BY RUTHERFORD BACKSCATTERING SPECTROMETRY
    HEHL, K
    WEBER, B
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 199 (1-2): : 387 - 391
  • [40] MATERIALS ANALYSIS WITH RUTHERFORD BACKSCATTERING SPECTROMETRY - APPLICATION TO CATALYSTS
    VANIJZENDOORN, LJ
    DEVOIGT, MJA
    REACTION KINETICS AND CATALYSIS LETTERS, 1993, 50 (1-2): : 131 - 137
12345