共 40 条
- [31] Deep learning-based image quality adaptation for die-to-database defect inspection METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII, 2024, 12955
- [32] Enhancing productivity and sensitivity in mask production via a Fast Integrated die-to-database T plus R Inspection PHOTOMASK TECHNOLOGY 2007, PTS 1-3, 2007, 6730
- [33] A new die-to-database mask inspection system with i-line optics for 256 Mbit and 1 Gbit DRAMs PHOTOMASK AND X-RAY MASK TECHNOLOGY IV, 1997, 3096 : 415 - 422
- [34] High productivity object-oriented defect detection algorithms for the new modular die-to-database reticle inspection platform EMLC 2005: 21ST EUROPEAN MASK AND LITHOGRAPHY CONFERENCE, 2005, 5835 : 290 - 299
- [35] A gray map reference pattern generator of a die-to-database mask inspection system for 256Mbit and 1Gbit DRAMs PHOTOMASK AND X-RAY MASK TECHNOLOGY V, 1998, 3412 : 544 - 551
- [37] Die-to-database verification tool for detecting CD errors, which are caused by OPC features, by using mass gate measurement and layout information METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXI, PTS 1-3, 2007, 6518
- [38] Advanced X-ray mask Inspection System (AXIS) using Scanning Electron Microscopy for Sub-70nm Die-to-Database Inspections METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XX, PTS 1 AND 2, 2006, 6152
- [39] Semi-transparent isolated defects detection by die to database mask inspection using virtual scanning algorithms for subpixel resolution 20TH EUROPEAN CONFERENCE ON MASK TECHNOLOGY FOR INTEGRATED CIRCUITS AND MICROCOMPONENTS, 2004, 5504 : 26 - 35