DETERMINATION OF LOCAL ORIENTATION OF SPECIMENS UNDER A SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

SHARAPOV, VV

机构：

来源：

INDUSTRIAL LABORATORY | 1980年 / 46卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：49 / 51

页数：3

共 50 条

[41] LOCAL FIELD EFFECTS ON VOLTAGE CONTRAST IN THE SCANNING ELECTRON-MICROSCOPE
NAKAMAE, K
FUJIOKA, H
URA, K
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1981, 14 (11) : 1939 - &
[42] APPARATUS FOR ANNEALING OF ELECTRON-MICROSCOPE SPECIMENS UNDER CONTROLLED ATMOSPHERES
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[J]. JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR): : 179 - 185
[43] ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE
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[J]. JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 284 - 284
[44] SAMPLING SCANNING ELECTRON-MICROSCOPE
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GOPINATH, A
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (03): : 229 - 233
[45] MICROTOMOGRAPHY IN A SCANNING ELECTRON-MICROSCOPE
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[J]. SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1986, 53 (02): : 95 - 100
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[47] MICROMANIPULATOR FOR SCANNING ELECTRON-MICROSCOPE
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HAYES, TL
[J]. JOURNAL OF ULTRASTRUCTURE RESEARCH, 1972, 38 (1-2): : 214 - &
[48] SCANNING ELECTRON-MICROSCOPE AUTOFLUOROGRAPHY
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ALEXANDER, JV
[J]. BIOLOGY OF THE CELL, 1981, 40 (02) : 99 - 102
[49] STEREOTECHNIQUES WITH SCANNING ELECTRON-MICROSCOPE
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[J]. MIKROSKOPIE, 1972, 27 (11-1) : 358 - &
[50] THE DEVELOPMENT OF THE SCANNING ELECTRON-MICROSCOPE
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[J]. ADVANCES IN IMAGING AND ELECTRON PHYSICS, 1985, : 443 - 482