APPARATUS FOR ANNEALING OF ELECTRON-MICROSCOPE SPECIMENS UNDER CONTROLLED ATMOSPHERES

被引：2
|
作者：
KRITZINGER, S [1 ]
MONACI, T [1 ]
RONANDER, E [1 ]
机构：
[1] UNIV STELLENBOSCH,DEPT PHYS,STELLENBOSCH 7600,SOUTH AFRICA
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1975年 / 103卷 / MAR期
关键词：
D O I：
10.1111/j.1365-2818.1975.tb03892.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：179 / 185
页数：7
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