ON MOIRE FRINGES AS FOURIER TEST OBJECTS

被引：16
|
作者：
LOHMANN, AW
机构：
来源：
APPLIED OPTICS | 1966年 / 5卷 / 04期
关键词：
D O I：
10.1364/AO.5.000669
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：669 / &
相关论文
共 50 条
  • [41] Characteristic analysis of evanescent wave moire fringes
    Deng, Fabo
    Du, Chunlei
    Luo, Xiangang
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2008, 25 (03) : 443 - 447
  • [42] Behaviors of moire fringes induced by plate thickness
    Kim, Jaisoon
    Son, Jung-Young
    Lee, Kwang-Hoon
    Lee, Hyoung
    Park, Min-Chul
    JOURNAL OF OPTICS, 2015, 17 (03)
  • [43] Analysis of moire fringes by a solenoidal coil grating
    Yuk, KC
    Chang, S
    OPTICS COMMUNICATIONS, 2001, 195 (1-4) : 119 - 126
  • [44] ANALYSIS OF MOIRE FRINGES PRODUCED BY CENTROSYMMETRIC GRATINGS
    ARAI, Y
    KURATA, T
    JOURNAL OF MODERN OPTICS, 1987, 34 (08) : 1067 - 1075
  • [45] FLUID FILM THICKNESS MEASUREMENT WITH MOIRE FRINGES
    BROWNE, AL
    APPLIED OPTICS, 1972, 11 (10): : 2269 - &
  • [46] ON THE INTERPRETATION OF SHADOW-MOIRE FRINGES - CLOSURE
    DURELLI, AJ
    EXPERIMENTAL MECHANICS, 1980, 20 (09) : 324 - 324
  • [47] MOIRE FRINGES FROM DEFECTFREE EPITAXIAL FILMS
    HUTCHINSON, TE
    OLSEN, KH
    JOURNAL OF APPLIED PHYSICS, 1964, 35 (10) : 3084 - +
  • [48] ELECTRONIC HETERODYNE READOUT OF FRINGES IN MOIRE DEFLECTOMETRY
    STRICKER, J
    OPTICS LETTERS, 1985, 10 (06) : 247 - 249
  • [49] Subdivision and direction judgment of grating Moire fringes
    He, An-Guo
    Yu, Hong-Lin
    Zhu, Chuan-Xin
    Wang, Yuan-Gan
    Guangdian Gongcheng/Opto-Electronic Engineering, 2007, 34 (10): : 45 - 49
  • [50] Moire fringes in conductive atomic force microscopy
    Richarz, L.
    He, J.
    Ludacka, U.
    Bourret, E.
    Yan, Z.
    van Helvoort, A. T. J.
    Meier, D.
    APPLIED PHYSICS LETTERS, 2023, 122 (16)
12345