POLYSILANES - RADIATION SENSITIVE MATERIALS FOR MICROLITHOGRAPHY

被引:0
|
作者
MILLER, RD [1 ]
机构
[1] IBM CORP,DIV RES,ALMADEN RES CTR,SAN JOSE,CA 95120
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:119 / POLY
相关论文
共 50 条
  • [1] SOLUBLE POLYSILANES - AN INTERESTING NEW CLASS OF RADIATION SENSITIVE MATERIALS
    MILLER, RD
    HOFER, D
    FICKES, GN
    WILLSON, CG
    MARINERO, E
    TREFONAS, P
    WEST, R
    [J]. POLYMER ENGINEERING AND SCIENCE, 1986, 26 (16): : 1129 - 1134
  • [2] OLIGOORGANYLSILSESQUIOXANES - RADIATION-SENSITIVE SUBSTANCES FOR VACUUM MICROLITHOGRAPHY
    KORCHKOV, VP
    MARTYNOVA, TN
    [J]. JOURNAL OF APPLIED CHEMISTRY OF THE USSR, 1985, 58 (09): : 1923 - 1928
  • [3] Radiation chemistry of polymeric materials: novel chemistry and applications for microlithography
    Reichmanis, E
    Nalamasu, O
    Houlihan, FM
    Novembre, AE
    [J]. POLYMER INTERNATIONAL, 1999, 48 (10) : 1053 - 1059
  • [4] POLYMER MATERIALS FOR MICROLITHOGRAPHY
    REICHMANIS, E
    THOMPSON, LF
    [J]. CHEMICAL REVIEWS, 1989, 89 (06) : 1273 - 1289
  • [5] POLYMER MATERIALS FOR MICROLITHOGRAPHY
    REICHMANIS, E
    THOMPSON, LF
    [J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1987, 17 : 235 - 271
  • [6] Optical materials for microlithography applications
    Westerhoff, T
    Knapp, K
    Moersen, E
    [J]. INORGANIC OPTICAL MATERIALS, 1998, 3424 : 10 - 19
  • [7] NEW MATERIALS FOR OPTICAL MICROLITHOGRAPHY
    MILLER, RD
    MACDONALD, SA
    [J]. JOURNAL OF IMAGING SCIENCE, 1987, 31 (02): : 43 - 46
  • [8] DESIGNING RESIST MATERIALS FOR MICROLITHOGRAPHY
    FRECHET, JMJ
    HAVARD, JM
    LEE, SM
    SHIM, SY
    URANKAR, EJ
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1995, 209 : 3 - PMSE
  • [9] Radiation effects on branching polysilanes
    Maeda, K
    Seki, S
    Tagawa, S
    Shibata, H
    [J]. RADIATION PHYSICS AND CHEMISTRY, 2001, 60 (4-5) : 461 - 466
  • [10] Polysilanes - Advanced materials for optoelectronics
    Nespurek, S
    Wang, G
    Yoshino, K
    [J]. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2005, 7 (01): : 223 - 230