GENERALIZED HURST EXPONENT OF THE CARBON THIN FILM SURFACE

被引：0
|
作者：
Borisyuk, V. N. [1 ]
Kassi, Jassim [1 ]
Holovchenko, A. I. [1 ]
机构：
[1] Sumy State Univ, 2 Rimskii Korsakov Str, UA-40007 Sumy, Ukraine
来源：
JOURNAL OF NANO- AND ELECTRONIC PHYSICS | 2011年 / 3卷 / 04期
关键词：
SELF-SIMILARITY; CARBON THIN FILMS; HURST EXPONENT; FRACTAL DIMENSION;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Self-similar structure of the carbon thin film surface, obtained by magnetron sputtering, is investigated numerically. Statistical parameters are calculated within two dimensional multifractaldetrended fluctuation analysis. The numerical model of the surfaces under investigation was build from the SEM images of the carbon thin film. It is shown that the self-similarity in surface structure preserves through different resolutions of the SEM images.
引用
收藏
页码：20 / 26
页数：7
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