DISTRIBUTIONS OF SECONDARY PARTICLES AROUND VARIOUS TARGETS EXPOSED TO 50 MEV PROTONS

被引:5
|
作者
FASSO, A [1 ]
HOFERT, M [1 ]
机构
[1] CERN,GENEVA,SWITZERLAND
来源
NUCLEAR INSTRUMENTS & METHODS | 1976年 / 133卷 / 02期
关键词
D O I
10.1016/0029-554X(76)90610-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:213 / 218
页数:6
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