AUTOPROBE TESTING FOR EMITTER-COLLECTOR SPIKES IN MICROWAVE BIPOLAR-TRANSISTORS

被引：0
|
作者：
TAUSCH, J [1 ]
机构：
[1] TEKTRONIX INC,BEAVERTON,OR 97077
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1975年 / 22卷 / 11期
关键词：
D O I：
10.1109/T-ED.1975.18271
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1052 / 1053
页数：2
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