AUTOPROBE TESTING FOR EMITTER-COLLECTOR SPIKES IN MICROWAVE BIPOLAR-TRANSISTORS

被引：0

作者：

TAUSCH, J ^{[1
]}

机构：

[1] TEKTRONIX INC,BEAVERTON,OR 97077

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1975年 / 22卷 / 11期

关键词：

D O I：

10.1109/T-ED.1975.18271

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1052 / 1053

页数：2

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