INVESTIGATION OF A CLEAVED SILICON SURFACE BY MICROWAVE AND OPTICAL REFLECTION METHODS

被引：0
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作者：
BELOKONOV, AN
GALAEV, AA
MILYAEV, VA
NIKITIN, VA
PARKHOMENKO, YN
SHIRKOV, AV
机构：
来源：
SOVIET PHYSICS SEMICONDUCTORS-USSR | 1985年 / 19卷 / 02期
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中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
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页码：217 / 218
页数：2
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