INVESTIGATION OF A CLEAVED SILICON SURFACE BY MICROWAVE AND OPTICAL REFLECTION METHODS

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作者：

BELOKONOV, AN

GALAEV, AA

MILYAEV, VA

NIKITIN, VA

PARKHOMENKO, YN

SHIRKOV, AV

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来源：

SOVIET PHYSICS SEMICONDUCTORS-USSR | 1985年 / 19卷 / 02期

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中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

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页码：217 / 218

页数：2

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