共 50 条
- [42] ON-CHIP TESTING OF RANDOM-ACCESS MEMORIES [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1994, 5 (04): : 367 - 376
- [45] DECODING SCHEME FOR MOS RANDOM-ACCESS MEMORIES. [J]. IBM Technical Disclosure Bulletin, 1975, 17 (10): : 2832 - 2833
- [46] Switching in polymeric resistance random-access memories (RRAMS) [J]. ORGANIC ELECTRONICS, 2008, 9 (01) : 119 - 128
- [48] FAULT TOLERANCE IN N-MOS RANDOM-ACCESS MEMORIES WITH DYNAMIC REDUNDANCY METHODS [J]. MICROELECTRONICS AND RELIABILITY, 1988, 28 (02): : 193 - 200