SPUTTERING IN HIGH-VOLTAGE ELECTRON-MICROSCOPE

被引：34

作者：

CHERNS, D ^{[1
]}

MINTER, FJ ^{[1
]}

NELSON, RS ^{[1
]}

机构：

[1] ATOM ENERGY RES ESTAB,DIV MET,HARWELL,OXFORDSHIRE,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS | 1976年 / 132卷 / JAN-F期

关键词：

D O I：

10.1016/0029-554X(76)90760-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：369 / 376

页数：8

共 50 条

[41] DIRECT OBSERVATION OF CRACK FORMATION IN A HIGH-VOLTAGE ELECTRON-MICROSCOPE
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[42] INSITU DEFORMATION OF MICAS - A HIGH-VOLTAGE ELECTRON-MICROSCOPE STUDY
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[43] PERFORMANCE PARAMETERS OF IMAGE CONVERTERS FOR THE HIGH-VOLTAGE ELECTRON-MICROSCOPE
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[44] HIGH-PRECISION TILT STAGE FOR THE HIGH-VOLTAGE ELECTRON-MICROSCOPE
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[45] IMPROVEMENT OF RESOLUTION OF THE HIGH-VOLTAGE ELECTRON-MICROSCOPE BY MEANS OF AN ASYMMETRICAL LENS
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[46] CREEP UNDER IRRADIATION OF 316 STEEL, IN A HIGH-VOLTAGE ELECTRON-MICROSCOPE
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[47] INSITU OBSERVATION OF SOLIDIFICATION INTERFACES WITH A VERY HIGH-VOLTAGE ELECTRON-MICROSCOPE
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[48] HIGH-VOLTAGE ELECTRON-MICROSCOPE OBSERVATION OF MULLER CELL IN VERTEBRATE RETINA
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[49] PREPARATION AND OBSERVATION OF THICK BIOLOGICAL SECTIONS IN HIGH-VOLTAGE ELECTRON-MICROSCOPE
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[50] CREEP UNDER IRRADIATION OF 316 STEEL IN THE HIGH-VOLTAGE ELECTRON-MICROSCOPE
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