INSITU OBSERVATION OF SOLIDIFICATION INTERFACES WITH A VERY HIGH-VOLTAGE ELECTRON-MICROSCOPE

被引：2

|

作者：

CAMEL, D

LEMAIGNAN, C

PELISSIER, J

机构：

来源：

JOURNAL OF CRYSTAL GROWTH | 1979年 / 47卷 / 02期

关键词：

D O I：

10.1016/0022-0248(79)90259-8

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

收藏

页码：317 / 319

页数：3

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