STRUCTURE OF THIN LEAD OXIDE LAYERS AS DETERMINED BY X-RAY-DIFFRACTION

被引：33
|
作者：
LIGHT, TB [1 ]
ELDRIDGE, JM [1 ]
MATTHEWS, JW [1 ]
GREINER, JH [1 ]
机构：
[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
来源：
JOURNAL OF APPLIED PHYSICS | 1975年 / 46卷 / 04期
关键词：
D O I：
10.1063/1.321799
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1489 / 1492
页数：4
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